Quantitative Analysis for RBS and PIXE Spectrums of Thin Cu2ZnSnS4 (CZTS) Films

The objective of this work is to introduce a different technique existing studies that determine the stoichiometric ratios thin CZTS structures. To end, targets were propagated by sol-gel process and later RBS PIXE spectra achieved irradiating these samples with protons 3.034 MeV energy into microbeam chamber. spectrum was taken detector collected IGe SDD detectors. As calibration performed fixed SIMNRA simulation program adjusted Gaussian function. In spectrum, quantitative analysis measurements could not be due presence Mo peak, which supplies electrical conductivity, while results close expected values. For this, least squares regression method carried out for reference material, analytical elemental amount specified coefficients found. It observed acquired convenient required values, except sulfur content. This fast simple can employed analytically help improve accuracy methods in literature used constituent quantities depth films. However, should compared inverse model or eigenvector methods.